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Home
About Journal
Editorial Board
Journal Online
Latest Accepted
Online First
Current Issue
Archive
Top View
Top Download
Top Cited
Advanced Search
Special Issues
Instructions to Authors
Ethics Policy
Download Center
Subscription
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Field Ion Microscope and Time-of-Flight Atom Probe and Their Applications to Quantitative Atom Microexamination on Solid Surface(I)
1983, 4(3): 1-1.
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Determination of Trace Volatile Organic Compounds in Drinking Water by GC-MS
1983, 4(3): 9-9.
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Quantitative Analysis of Tungsten Oxide by Incremental Method with Spark Source Mass Spectrometry Spectrometry
1983, 4(3): 22-22.
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Reverse Geometry Double Focusing Mass Spectrometers with High Performance
1983, 4(3): 29-29.
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Ion Cyclotron Resonance Mass Spectrometry
1983, 4(3): 35-35.
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Fast Atom Bombardment——A New Soft Ionization Technique
1983, 4(3): 42-42.
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Improving of the ZhH-1301 Mass Spectrometer for Static Analysis
1983, 4(3): 62-62.
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