A Study on Standard of Ion Exchange Membrane of Rare-Earth Element and Determination of Relative Sputter Coefficient of Secondary Ion[J]. Journal of Chinese Mass Spectrometry Society, 1986, 7(4): 57-57.
Citation:
A Study on Standard of Ion Exchange Membrane of Rare-Earth Element and Determination of Relative Sputter Coefficient of Secondary Ion[J]. Journal of Chinese Mass Spectrometry Society, 1986, 7(4): 57-57.
A Study on Standard of Ion Exchange Membrane of Rare-Earth Element and Determination of Relative Sputter Coefficient of Secondary Ion[J]. Journal of Chinese Mass Spectrometry Society, 1986, 7(4): 57-57.
Citation:
A Study on Standard of Ion Exchange Membrane of Rare-Earth Element and Determination of Relative Sputter Coefficient of Secondary Ion[J]. Journal of Chinese Mass Spectrometry Society, 1986, 7(4): 57-57.
A Study on Standard of Ion Exchange Membrane of Rare-Earth Element and Determination of Relative Sputter Coefficient of Secondary Ion
The article reports a new method using home type E-105 ion exchangmembrane to concentrate Rare-Earth Element (REE) by which the standardsample of REE is developed. In addition, the relative sputter coefficient ofsecoudary ion of REE has been determined by type LT-1 and IMS-300 ionmicroprobe mass analyzer. The average standard deviation is less than 20%.
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