Progress In Molecular Secondary Ion Mass Spectrometry[J]. Journal of Chinese Mass Spectrometry Society, 1986, 7(4): 1-1.
Citation: Progress In Molecular Secondary Ion Mass Spectrometry[J]. Journal of Chinese Mass Spectrometry Society, 1986, 7(4): 1-1.

Progress In Molecular Secondary Ion Mass Spectrometry

  • A review summarized progress in molecular secondary ion mass spectrome-try (molecular SIMS) with emphasis ou the mechanism of the sputtering pro-cesses, matrix effects in mechanistic studies, fragmentations, applications andthe areas of interest in which activity is expected to increase in the future.
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