JIA Jing, ZHANG Ying-xin, TONG Jian, LI Wen-jun. Determination of Impurity Elements in High Purity Graphite by ICP-MS after Mixture Acid Digestion in Reflux Condenser System[J]. Journal of Chinese Mass Spectrometry Society, 2009, 30(4): 229-233.
Citation: JIA Jing, ZHANG Ying-xin, TONG Jian, LI Wen-jun. Determination of Impurity Elements in High Purity Graphite by ICP-MS after Mixture Acid Digestion in Reflux Condenser System[J]. Journal of Chinese Mass Spectrometry Society, 2009, 30(4): 229-233.

Determination of Impurity Elements in High Purity Graphite by ICP-MS after Mixture Acid Digestion in Reflux Condenser System

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  • Corresponding author:

    JIA Jing

  • Received Date: February 04, 2009
  • Revised Date: May 10, 2009
  • The method of determination of 35 trace impurity elements in high purity graphite was established. Samples were digested by the mixture of 1 mL HNO3,1 mL HClO4 and 3 mL H2SO4 at 220 ℃ in reflux condenser system. Sc, Rh, Re and Cs were utilized as internal standards to correct the signal drift. The detection limit of various elements is from 0.000 6 μg•L-1 to 0.1 μg•L-1, the recovery rates are between 82% and 110%, the RSD(n=10) is in the range of 0.58% and 5.8%. The method is suitable for the determination of impurity elements in high purity graphite.
  • [1]
    蔡绍勤,李昌世.高纯金属和半导体材料分析[M].北京:冶金工业出版社,1995:328-329.
    [2]
    YUKIHIRO K, AKIRA N. Determination of trace metal impurities in graphite powders by acid pressure decomposition and inductively coupled plasma atomic emission spectrometry[J]. Analyst, 1993, 118: 827-830.
    [3]
    WATANABE K, INAGAWA J. Determination of impurity elements in graphite by acid decomposition-inductively coupled plasma atomic emission spectrometry[J]. Analyst, 1996, 121(5): 623-625.
    [4]
    张爱滨,魏进武,王〓燕,等.顺序扫描ICP-AES法测定高纯石墨灰分中14 种杂质金属元素的方法研究[J].青岛海洋大学学报,2003,33(4):609-614.
    [5]
    WATANABE M, NARUKAWA A. Determination of impurity elements in high purity graphite by inductively coupled plasma atomic emission spectrometry after microwave decomposition[J]. Analyst, 2000, 125: 1 189-1 191.
    [6]
    SCHFFER U, KRIVAN V. Analysis of high purity graphite and silicon carbide by direct solid sampling electrothermal atomic absorption spectrometry[J]. Fresenius J Anal Chem, 2001, 371(6): 859-866.
    [7]
    YAMAGUCHI H, ITOH S, IGARASHI S, et al. Determination of trace impurities in graphite and silicon carbide by total reflection X-ray fluorescence spectrometry after homogeneous liquidliquid extraction[J]. ISIJ International, 2000, 40(8): 779-782.
    [8]
    国家技术监督局. GB/T 3521-95 石墨化学分析方法[S].北京:中国标准出版社,1995.
    [9]
    ROBERT THOMAS. ICP-MS实践指南[M]. 李金英, 译. 北京:原子能出版社,2007:85.
    [10]
    谢华林,聂西度,唐有根.高分辨等离子体质谱法直接测定高纯镓中的痕量元素[J].分析化学,2006,34(11):1 570-1 574.

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