电感耦合等离子体质谱法测定高纯氧化镧中稀土和非稀土杂质

Determination of Trace REEs and Non-REEs Impurities in High Pure Lanthanum Oxide by Inductively Coupled Plasma Mass Spectrometry

摘要: 利用电感耦合等离子体质谱技术研究建立了直接测定高纯氧化镧中 1 4种稀土及 1 8种非稀土杂质的分析方法。考察了测量过程中的质谱干扰及基体元素产生的基体效应。引入内标元素 In,有效补偿了基体元素对待测元素的抑制效应 ,选择同位素建立校正公式克服了质谱干扰。稀土杂质的测定下限为 0 .0 0 1 2～0 .0 0 93 μg/g,非稀土杂质测定下限为 0 .0 0 2 3～ 0 .67μg/g,加标回收率达到 92 %～ 1 0 8% ,相对标准偏差( RSD)为 0 .4%～ 3 .3 % ,方法适于 99.99%～ 99.9999%纯度氧化镧中稀土及非稀土杂质的快速测定

Abstract: A analytical method for the directly determination of 14 REEs and 18 Non-REEs impurities in high pure La 2O 3 by ELAN 9000 inductively coupled plasma mass spectrometry had been established. The matrix and spectral interference was studied. The signal suppression caused by La matrix was compensated by adding internal reference element as In and the spectral interference was also corrected by correction equations for interfered ions as 142Ce, 160Gd. The detection limits for REEs are 0.001 2-0.009 3μg/g and 0.002 3-0.67 μg/g for Non-REEs. The recovery is 92%-108% and the precision (RSD) is 0.4%- 3.3%. Finally, the method is suited for rapidly determination of REEs and Non-REEs impurities in La 2O 3 with purity of 99.99%-99.999 9%.