二次离子质谱(SIMS)分析技术及应用进展

Recent Developments on Secondary Ion Mass Spectrometry

  • 摘要: 二次离子质谱 ( SIMS)比其他表面微区分析方法更灵敏。由于应用了中性原子、液态金属离子、多原子离子和激光一次束 ,后电离技术 ,离子反射型飞行时间质量分析器 ,离子延迟探测技术和计算机图像处理技术等 ,使得新型的 SIMS的一次束能量提高到 Me V,束斑至亚μm,质量分辨率达到 1 5 0 0 0 ,横向和纵向分辨率小于 0 .5μm和 5 nm,探测限为 ng/g,能给出二维和三维图像信息。 SIMS能用于矿物、核物质、陨石和宇宙物质的半定量元素含量和同位素丰度测定 ,能鉴定出高挥发性、热不稳定性的生物大分子 ,能进行横向和纵向剖析 ,能进行单颗粒物、团蔟、聚合物、微电子晶体、生物芯片、生物细胞同位素标记和单核苷酸多肽性分型 ( SNP)测定 ,能观测出含有 2 0 0 0碱基对的脱氧核糖核酸 ( DNA)的准分子离子峰。以SIMS在同位素、颗粒物、大分子、生物等研究领域的应用为重点 ,结合实例 ,对 SIMS仪器和技术进展进行了综述

     

    Abstract: Secondary ion mass spectrometry(SIMS) is more sensitive than other surface microregion analysis instrumentals. Because the neutral atom, liquid metal ion and laser primary beam, the post ionization, the time of flight analyzer with retarding electrode, the ion delay detection and the computarizing image technique have been used in SIMS, it has the following feature parameters: the energy and spot of primary beam is up to MeV and down to less μm, the mass resolution is up to 15 000, the lateral and depth resolution come to less 0.5 μm and 5 nm, the detection limit is down to ng/g, and the other fearure is to giving two or three dimensional image. SIMS can be used to detect the half quatitative element concentration and isotope abundance in the mineral, nucleomatter, meteorite and cosmomatter, to identify the high volatile and thermal instable biomacromolecule, to analyze the lateral and depth profile to giving ion image information. The applicable region of SIMS has been extended to measuring of the single particulate matter, cluster, polymer, microelectronic crystal piece, isotope label compound in the biological cell, microchip, single nucleotide polymorphisms (SNP) genotyping, ect,. The quasimolecular ion peak of deoxyribonucleic acid (DNA) contained twenty hundred base pairs was observed by MALDI TOFMS. The main achievements are summarized and several key applications are illustrated in great detail.

     

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