二次离子质谱法中的一些新装置和新仪器
Some New Devices and Instruments of Secondary Ion Mass Spectrometry
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摘要: 本文简要介绍近年来国外二次离子质谱法中出现的一些新装置和新仪器的原理、性能及其应用的可能性。Abstract: A lot of improvements and developments of secondary ion mass spectrome-try (SIMS) have been done in order to expand its applications to more fields.In the present paper, the principle, characteristic and the possible applicati-on of some abroad new SIMS devices and SIMS instruments developed in re-cent years are introduced briefly.