Abstract: A method for determination of 14 trace elements in geological samples us-ing SSMS is described. Lu is used as the internal standard element and gra-phite is the conductive matrix. The relative sensitivity factors are measured byanalysing the standard basalt BCR-1 and synthetic samples. The superpositioninterferences on these elements are corrected according to the isotope ratios ofelements. The mean analytical precision is 20% (RSD). 24 geological standardsamples were analysed and the results are comparable to the certified or reco-mmended values.